FAULT DIAGNOSIS OF FULLY DIFFERENTIAL CIRCUITS IN ELECTRONIC EMBEDDED SYSTEMS |
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| Zbigniew Czaja, Wojciech Toczek |
- Abstract:
- A new Built-In-Self-Test scheme for diagnosis of analog fully differential circuits in embedded mixed-signal microsystems is presented. The measurement procedure is realized by the internal resources of the microcontroller. The real and imaginary parts of the output differential voltage are measured with common-mode excitation of the circuit under test (CUT). The diagnosis procedure is based on the fault dictionary stored in the memory of the microcontroller. The dictionary is created in polar coordinates during the design of the system.
- Keywords:
- BIST, fault diagnosis, fully differential circuits
- Download:
- IMEKO-WC-2009-TC10-313.pdf
- DOI:
- -
- Event details
- Event name:
- XIX IMEKO World Congress
- Title:
Fundamental and Applied Metrology
- Place:
- Lisbon, PORTUGAL
- Time:
- 06 September 2009 - 11 September 2009