INFLUENCE OF RADIATION DIFFRACTION UPON METROLOGICAL PARAMETERS OF THE IR LINE SCANNER
Leszek Rozanski, Stanislaw Poloszyk
Abstract:
The influence of IR radiation diffraction upon geometrical resolution of the IR line scanner has been analysed in the paper. Analysis of IR line scanner properties in band 3 – 5 µm and 8 – 12 µm proved that when applying the aperture diaphragms the influence of the radiant diffraction upon geometrical resolution may be significant. This influence is stronger for larger f numbers N in the applied optical systems. It was shown that for large values of f numbers the thermal resolution of the IR line scanner can be improved by reducing the bandwidth of the electronic system of the scanner, without considerable deterioration of geometrical resolution.
Keywords:
IR line scanner, metrological parameters
Download:
IMEKO-WC-2009-TC12-393.pdf
DOI:
-
Event details
Event name:
XIX IMEKO World Congress
Title:

Fundamental and Applied Metrology

Place:
Lisbon, PORTUGAL
Time:
06 September 2009 - 11 September 2009
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