ACCURACY, TRUENESS, AND PRECISION: CONSIDERATIONS BASED ON THE INTERNATIONAL VOCABULARY OF METROLOGY (VIM, 3RD ED.) AND RELATED STANDARDS
Roberto Buccianti, Marco Cibien, Luca Mari, Bruno Rebaglia
Abstract:
The paper analyzes the concept of accuracy, and the related ones of trueness and precision, as aimed at characterizing the behavior of measurement processes, and highlights how such concepts, as currently defined by some relevant standards, should be reformulated to guarantee their consistency. Finally, some preliminary suggestions are proposed to this goal.
Keywords:
measurement science, measurement process behavior, accuracy
Download:
IMEKO-WC-2009-TC7-417.pdf
DOI:
-
Event details
Event name:
XIX IMEKO World Congress
Title:

Fundamental and Applied Metrology

Place:
Lisbon, PORTUGAL
Time:
06 September 2009 - 11 September 2009
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