THE I-V CHARACTERISTIC COMPARISON METHOD IN ELECTRONIC COMPONENT DIAGNOSTICS |
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| P. Neumann, M. Pospisilik, P. Skocik, M. Adamek |
- Abstract:
- I-V characteristics of individual electronic components or electronic circuits have been playing a very important role in diagnostics for many years. The latest technological advance has extended the analytical potential of that method even more. This paper presents some examples how the I-V characteristic comparison can reveal the differences between the chosen approved model component and some other alternative components manufactured by different producers. The differences might be caused also with a treatment history like thermal or electrostatic discharge exposition.
- Keywords:
- I-V characteristic, scan profile, pin print, comparison criteria, model component
- Download:
- IMEKO-WC-2012-TC10-P2.pdf
- DOI:
- -
- Event details
- Event name:
- XX IMEKO World Congress
- Title:
Metrology for Green Growth
- Place:
- Busan, REPUBLIC of KOREA
- Time:
- 09 September 2012 - 12 September 2012