MEASUREMENT OF EFFECTIVE ELECTRON SOURCE SIZE BY USING NANO-BIPRISM |
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| B. Cho, Y. Cho, S. Ahn, H. Lee, B. Park, C. Hwang |
- Abstract:
- The spatial coherence length of electron beam was measured by using multi-walled carbon nanotubes as an element of a nano-biprism. With decreasing the source temperature from 300 K to 78 K, the visibility of the interference fringe of emitted electrons increases by a factor of 3, and the band of the interference pattern widens by a factor of 5.
- Keywords:
- coherence length, electron beam, biprism
- Download:
- IMEKO-WC-2012-SS2-O10.pdf
- DOI:
- -
- Event details
- Event name:
- XX IMEKO World Congress
- Title:
Metrology for Green Growth
- Place:
- Busan, REPUBLIC of KOREA
- Time:
- 09 September 2012 - 12 September 2012