PROBE SYSTEM FOR DETECTING SMALL DISPLACEMENT |
|---|
| R. Furutani |
- Abstract:
- We proposed the probe system for CMM, which consisted of elastic hinges, QPD and ball lens to detect the small displacement of stylus. The contact force increases rather than other probes; touch trigger probe etc., we try to totally reduce the contact force by the more sensitive detector.In our concept, as the stylus of this probe is supported by the elastic hinge rigidly, the probe system should detect the displacement of the stylus before the stylus make the plastic deformation on workpiece. Therefore, the detector should demand high sensitivity in order to prevent the deformation on workpiece as small as possible. In this paper, we will show the resolution, contact force and directional characteristics of this probe system.
- Keywords:
- contact probe, contact force, Coordinate Measuring Machine
- Download:
- IMEKO-WC-2000-TC14-P368.pdf
- DOI:
- -
- Event details
- Event name:
- XVI IMEKO World Congress
- Title:
Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future
- Place:
- Vienna, AUSTRIA
- Time:
- 25 September 2000 - 28 September 2000