DETECTION OF UNEVEN FLATNESS ON LIQUID SURFACE
H. Narahara, H. Suzuki, M. Suga
Abstract:
This research is aimed at improving accuracy of stereolithography (Rapid prototyping) system. The objective of this paper is to detect the flatness of freeform liquid surface. The principle of measurement is performed by obtaining grating image of total reflection from freeform liquid surface. The detection is performed by two steps, coarse detection and fine one. Coarse detection is used for searching widely deformed area and fine detection is used for verifying flatness of freeform liquid surface. The phase detection of grating image is based on Linear Digital Phase-Locked Loop (L-DPLL).
Keywords:
rapid prototyping, total reflection, flatness
Download:
IMEKO-WC-2000-TC14-P387.pdf
DOI:
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Event details
Event name:
XVI IMEKO World Congress
Title:

Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

Place:
Vienna, AUSTRIA
Time:
25 September 2000 - 28 September 2000
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