NEW METHOD FOR HIGH PRECISE ANGULAR MEASUREMENTS |
|---|
| V. Portman, B. Peschansky |
- Abstract:
- A new method of large-angle measurements is described. Its high accuracy results from averaging some thousands of readings of about hundred replicas of the measured angle. An optoelectronic device based on this method has been developed, produced, tested, and applied. The design and operation of the device is described. The device consists of optical grating scales of the regular accuracy. It results in simplification of the structure of the measuring device and increases its reliability. A calibration of the pilot batch of the device shows that its limit error is in the range of 0.5 arcsec. Examples of the real-life applications of the device for different setups of the measured equipment provide support for high accuracy and high efficiency of the developed method.
- Keywords:
- accuracy, angular measurement, optoelectronic device
- Download:
- IMEKO-WC-2000-TC14-P396.pdf
- DOI:
- -
- Event details
- Event name:
- XVI IMEKO World Congress
- Title:
Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future
- Place:
- Vienna, AUSTRIA
- Time:
- 25 September 2000 - 28 September 2000