SURFACE TOPOGRAPHY REPRESENTATION IN PROFILOMETRY |
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| M. Wieczorowski, A. Cellary, J. Chajda |
- Abstract:
- In the paper the authors presented a comparison analysis of three different probes used for surface topography measurement. Skid and skidless stylus probes were used as contact pick-ups, while an optical autofocussing pick-up was applied as a non-contact one. The analysis was performed using several different topography parameters. It showed that a skid causes some relatively small distortions as far as the surface representation is concerned. The optical probe on the other hand proved to be a very difficult measuring tool, particularly for surfaces with steep slopes and sharp edges. Yet even for very smooth surfaces a great attention must be paid while measuring with this kind of pick-up is considered.
- Keywords:
- surface topography, profilometry, probes
- Download:
- IMEKO-WC-2000-TC14-P409.pdf
- DOI:
- -
- Event details
- Event name:
- XVI IMEKO World Congress
- Title:
Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future
- Place:
- Vienna, AUSTRIA
- Time:
- 25 September 2000 - 28 September 2000