CMM PROBE TESTING BY MEANS OF A LOW FORCE SENSOR
A. Wozniak, M. Dobosz
Abstract:
The method and the computerised set-up for the accuracy of touch trigger probe testing, outside CMM is discussed. A high resolution interference displacement transducer with a low measuring force is applied. The results of preliminary tests of TP2-5W and TP6 (Renishaw) probe in XYZ space are shown. The metrological characteristics of the probe are analysed.
Keywords:
coordinate measuring machines; touch trigger probe
Download:
IMEKO-WC-2000-TC14-P410.pdf
DOI:
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Event details
Event name:
XVI IMEKO World Congress
Title:

Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

Place:
Vienna, AUSTRIA
Time:
25 September 2000 - 28 September 2000
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