MEASUREMENT OF ADC INTEGRAL NONLINEARITY VIA DFT |
|---|
| F. Adamo, F. Attivissimo, N. Giaquinto |
- Abstract:
- The paper presents a new methodology, based on the Discrete Fourier Transform of the output, for measuring the integral nonlinearity of an ADC. The new method, unlike the usual histogram test, gives the best polynomial approximation (the “smooth part”) of the integral nonlinearity, which is responsible for the spurious harmonics above the ADC noise floor, and can be performed with great accuracy and repeatability with as few as 8,000 samples, irrespective the ADC resolution. This makes this test by far faster than the histogram test for high-resolution devices.
- Keywords:
- Discrete Fourier Transform, measuring integral nonlinearity, histogram test
- Download:
- IMEKO-WC-2000-EWADC-P596.pdf
- DOI:
- -
- Event details
- Event name:
- XVI IMEKO World Congress
- Title:
Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future
- Place:
- Vienna, AUSTRIA
- Time:
- 25 September 2000 - 28 September 2000