ADC HISTOGRAM TEST USING SMALL-AMPLITUDE INPUT WAVES

F. C. Alegria, P. Arpaia, P. Daponte, A. C. Serra
Abstract:
The experimental investigation on a histogram test for analog-to-digital converters (ADCs) using as stimulus signals small-amplitude triangular waves superimposed to variable DC levels is presented. The test allows inexpensive triangular generators to be used and a dramatic reduction of the duration of the static test for the characterisation of high-resolution ADCs. The experimental comparison of the investigated test with a fullscale wave-based test and with the standard static test for different ADC architectures highlights its effectiveness.
Keywords:
ADC testing, histogram method, triangular wave
Download:
IMEKO-WC-2000-EWADC-P598.pdf
DOI:
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Event details
Event name:
XVI IMEKO World Congress
Title:

Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

Place:
Vienna, AUSTRIA
Time:
25 September 2000 - 28 September 2000