MEASURING OF EFFECTIVE RESOLUTION OF Σ-Δ ADC
J. Holub, J. Vedral
Abstract:
Measurement and testing methodology for Σ-Δ Analog-to-Digital converters with nominal resolution 16 (24) bits is presented. The dependancies of effective resolution on the first notch frequency and gain are given.
Keywords:
ADC, testing, Σ-Δ modulation
Download:
IMEKO-WC-2000-EWADC-P624.pdf
DOI:
-
Event details
Event name:
XVI IMEKO World Congress
Title:

Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

Place:
Vienna, AUSTRIA
Time:
25 September 2000 - 28 September 2000
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