SYSTEM FOR DYNAMIC TESTING OF ANALOG TO DIGITAL MODULES
J. Roztocil, V. Haasz, J. Brossmann
Abstract:
An automated system for dynamic testing of ISA, PCI and VXI modules in frequency range up to 1 MHz developed at Department of Measurement of FEE CTU Prague is presented. The application of the Hewlett-Packard E1430A high precision VXIbus digitizer for evaluation of testing signals is described.
Keywords:
AD modules dynamic testing, test system, VXI bus
Download:
IMEKO-WC-2000-EWADC-P640.pdf
DOI:
-
Event details
Event name:
XVI IMEKO World Congress
Title:

Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

Place:
Vienna, AUSTRIA
Time:
25 September 2000 - 28 September 2000
 Back