THE PROBLEM OF THE STANDARD CHARACTERIZATION OF ADC AND DIGITIZING WAVEFORM RECORDERS
M. Savino
Abstract:
The problem of the metrological qualification of data acquisition systems and of waveform recorder is a fundamental issue for both users and manufacturers of digital instruments.
The need for an improved industrial standard leading to unification and standardization in this field is a very pressing requirement. Users have to receive technical specifications written in standard format and manufacturers to obtain them following standard test procedure.
The Main goal of this paper is to underline the need of unifying the modeling, identification and optimization of ADC-based systems, by minimizing the number of the experimental procedures to be employed.
Keywords:
Digital Waveform Recorders, Analog-to-Digital Converters, data acquisition systems, metrological qualification
Download:
IMEKO-WC-2000-EWADC-P646.pdf
DOI:
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Event details
Event name:
XVI IMEKO World Congress
Title:

Measurement - Supports Science - Improves Technology - Protects Environment ... and Provides Employment - Now and in the Future

Place:
Vienna, AUSTRIA
Time:
25 September 2000 - 28 September 2000
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