ADCs DYNAMIC TESTING BY MULTIHARMONIC SINE FITTING ALGORITHMS |
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| Dominique Dallet, Dario Petri, Daniel Belega |
- Abstract:
- The paper investigates and compares the performances of two state-of-the-art MultiHarmonic Sine Fitting (MHSF) algorithms when used in the dynamic testing of an Analog-to-Digital Converter (ADC). The influence of the initial estimate of the test signal frequency on the uncertainty of the estimated ADC dynamic parameters is analyzed by using computer simulations. Moreover, the accuracies of the considered MHSF algorithms and the sine-fit algorithms suggested in the existing standards for ADCs testing are compared by means of both computer simulations and experimental results.
- Download:
- IMEKO-IWADC-2011-30.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- IWADC 2011
- Title:
16th IMEKO International Workshop on ADC Modeling and Testing - Data Converter Design, Modeling and Testing (together with IEEE ADC Forum) (IWADC)
- Place:
- Orvieto, ITALY
- Time:
- 30 June 2011 - 01 July 2011