Fault detection in complex analog circuits using Support Vector Machines |
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| Adrian Bilski, Jacek Wojciechowski |
- Abstract:
- The aim of this paper is to bring the reader closer to the diagnostics of complex analog systems with parametric faults, using Support Vector Machine (SVM) as a tool for fault location. The results of diagnostics of a video enhancer and two low-pass filters with the help of SVM network are presented, and various SVM kernel functions tested. A strategy for finding the optimal kernels and their parameters for the particular system under test is proposed. This paper is focused on linear systems diagnostics.
- Keywords:
- Complex analog systems, Support Vector Machine, parametric fault detection
- Download:
- IMEKO-TC10-2013-008.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC10
- Event name:
- TC10 Workshop 2013
- Title:
12th IMEKO TC10 Workshop "New Perspectives in Measurements, Tools and Techniques for Industrial Applications"
- Place:
- Florence, ITALY
- Time:
- 06 June 2013 - 07 June 2013