Detection and characterization of oscillatory transient using Spectral Kurtosis |
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| Jose María Sierra-Fernández, Juan José González de la Rosa, Agustín Agüera-Pérez, José Carlos Palomares-Salas |
- Abstract:
- This paper describes a new procedure for analyze oscillatory transient, based in the Spectral Kurtosis (SK). It gives the kurtosis of each frequency component, and it is related to the amplitude evolution. With all this information any frequency which amplitude keeps constant or suddenly change will be identified. This second case is the oscillatory transient, in which a specific frequency appears. SK detects and characterizes that frequency univoquely. Some theoretical situations and a real one will be analyzed in order to proof the great capacities of the SK in the analysis of this kind of defect.
- Keywords:
- power quality, spectral kurtosis, oscillatory transient, signal processing, spectral analysis
- Download:
- IMEKO-TC4-2013-036.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2013
- Title:
- 19th IMEKO TC4 Symposium Measurements of Electrical Quantities (together with 17th TC4 IWADC Workshop on ADC and DAC Modelling and Testing)
- Place:
- Barcelona, SPAIN
- Time:
- 18 July 2013 - 19 July 2013