Detection and characterization of amplitude defects using Spectral Kurtosis

Jose Maria Sierra-Fernandez, Juan José González de la Rosa, Agustín Agüera-Pérez, José Carlos Palomares-Salas
Abstract:
This paper describes a new procedure for analyze amplitude defects, based on Spectral Kurtosis (SK). It extracts the kurtosis of each frequency component, which is related to the amplitude evolution. The proposed procedure allows the identification and characterization of frequencies with constant or very variable amplitude. An amplitude defect involves a step in the amplitude level, and that affect to frequencies around 50 Hz, which originally are not present, and could be detected by the SK. Some theoretical situations and a real one will be analyzed in order to proof the great capacities of the SK in the analysis of this kind of defect.
Keywords:
power quality, spectral kurtosis, oscillatory transient, signal processing, spectral analysis
Download:
IMEKO-TC4-2013-037.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Symposium 2013
Title:
19th IMEKO TC4 Symposium Measurements of Electrical Quantities (together with 17th TC4 IWADC Workshop on ADC and DAC Modelling and Testing)
Place:
Barcelona, SPAIN
Time:
18 July 2013 - 19 July 2013