Time Domain Processing of Pulsed Differential Eddy Currents Testing Signals

Luís Rosado, Pedro Ramos, Moisés Piedade
Abstract:
The use of pulsed stimulus on Eddy Currents Testing is currently applied on multiple applications from conductivity measurements to defects detection on metallic parts. This type of stimulus is frequency rich since it is composed by multiple harmonics and this allows testing with different depth concentration of the eddy currents as they are subject to the skin effect. In this paper, pulsed stimuli are used while testing with a custom probe. The probe output signals are acquired and processed digitally in the time domain using a simple feature, its RMS value. Two-dimensional scans were performed allowing the imaging of a tested metallic part with different defects.
Keywords:
Eddy Currents Testing, Pulsed Stimulus, Time Domain Processing
Download:
IMEKO-TC4-2013-086.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Symposium 2013
Title:
19th IMEKO TC4 Symposium Measurements of Electrical Quantities (together with 17th TC4 IWADC Workshop on ADC and DAC Modelling and Testing)
Place:
Barcelona, SPAIN
Time:
18 July 2013 - 19 July 2013