Design And Implementation Of An Automatic Measurement System For The Characterization Of Power MOSFETs

Marcantonio Catelani, Lorenzo Ciani
Abstract:
In this paper the design and implementation of an automatic measurement system for the characterization of power MOSFETs is described. Such system allows to obtain a complete characterization of the MOSFET regardless of the final application, totally automated and thus a fast and cheap response to the industrial requests.
Keywords:
Automatic Measurement System, MOSFET
Download:
IMEKO-TC4-2013-100.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Symposium 2013
Title:
19th IMEKO TC4 Symposium Measurements of Electrical Quantities (together with 17th TC4 IWADC Workshop on ADC and DAC Modelling and Testing)
Place:
Barcelona, SPAIN
Time:
18 July 2013 - 19 July 2013