Precise Shape Measurement Method Using Scattered Light |
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| Katuhisa Saito, Susumu Sakano |
- Abstract:
- It is shown in the paper that the shape and the contour of the objects can be detected high-precisely using the scattered light. The simulation of the scattered light using the simulation software at first pursues the possibility of the high precise measurement. The possibility of the high-precise measurement is confirmed in the simulation. The simulation results are verified by the experiments next. It is shown that the precise micron meter order measurement is possible using the scattered light from the results of the simulation and the experiment. The method is applied to the inspection of the end shape on the polishing process of the optical fiber and the practicability of the method is confirmed. This method presets the industrial applications like the measurement of the shape of the products.
- Download:
- IMEKO-TC4-2005-010.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Workshop 2005
- Title:
10th IMEKO TC4 International Workshop on ADC Modelling and Testing - IWADC (together with XIVth IMEKO TC4 International Symposium on New Technologies in Measurement and Instrumentation)
- Place:
- Gdynia/Jurata, POLAND
- Time:
- 12 September 2005 - 15 September 2005