A Fault Diagnosis Method for Analog Parts of Embedded Systems Based on Time Response and Identification Curves in the 3-D Space |
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| Zbigniew Czaja |
- Abstract:
- A new 3-D version of the new fault diagnosis method of analog parts in embedded mixed microsystems based on microcontrollers is presented. It has the following advantages: measurements of the CUT can be made using only internal resources of popular microcontrollers, the diagnosis procedure does not require big computing power and the codes of its procedure do not occupy much space in the program memory of the microcontroller.
- Download:
- IMEKO-TC4-2005-068.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Workshop 2005
- Title:
10th IMEKO TC4 International Workshop on ADC Modelling and Testing - IWADC (together with XIVth IMEKO TC4 International Symposium on New Technologies in Measurement and Instrumentation)
- Place:
- Gdynia/Jurata, POLAND
- Time:
- 12 September 2005 - 15 September 2005