A System for the Characterization of High Resolution DACs and ADCs |
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| Umberto Pogliano |
- Abstract:
- This paper describes the system under construction at I.N.Ri.M. for the characterization of high resolution DACs and ADCs. The main measurement instrument used as a reference is a high precision sampling multimeter, which is properly configured for the measurement of both dc and ac voltages supplied by the DAC under test. A proper voltage pattern is supplied to the ADC under test by means of a multichannel output board put inside a computer, combined by suitable supplementary electronic circuits. The constructed signal is then measured by the multimeter and analyzed by the computer.
- Download:
- IMEKO-TC4-2005-100.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Workshop 2005
- Title:
10th IMEKO TC4 International Workshop on ADC Modelling and Testing - IWADC (together with XIVth IMEKO TC4 International Symposium on New Technologies in Measurement and Instrumentation)
- Place:
- Gdynia/Jurata, POLAND
- Time:
- 12 September 2005 - 15 September 2005