Coupling Dithering and Static Linearization in A/D Converters

F. Attivissimo, N. Giaquinto, A. M. L. Lanzolla, M. Savino
Abstract:
This paper presents a study of the performance attainable by combining two different methods of linearization algorithms for A/D converters: dithering (which removes errors due to quantization) and static look-up table (which removes errors due to INL). The theory and the simulation results show two very important facts, i.e.: (i) the amplitude of the dither signal must be chosen according to the INL of the converter, and should be greater than the usual value of 0.5 LSB rms; (ii) using both the linearization techniques allows one to attain (in absence of other sources of error) an arbitrary high number of effective bits, proportional to the logarithm of the averaged samples.
Keywords:
A/D conversion, error compensation, dithering
Download:
IMEKO-TC4-2005-105.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Workshop 2005
Title:

10th IMEKO TC4 International Workshop on ADC Modelling and Testing - IWADC (together with XIVth IMEKO TC4 International Symposium on New Technologies in Measurement and Instrumentation)

Place:
Gdynia/Jurata, POLAND
Time:
12 September 2005 - 15 September 2005