HISTOGRAM-BASED FEATURE EXTRACTION TECHNIQUE APPLIED FOR FAULT DIAGNOSIS OF ELECTRONIC CIRCUITS

Wojciech Toczek, Michal Kowalewski, Romuald Zielonko
Abstract:
In this paper we discuss and compare two feature extraction techniques: histogram-based and Principal Component Analysis. Comparison is done on an analog filter fault diagnosis example performed in the frequency domain. Both techniques are implemented in a neural network system for the off-line diagnosis of electronic analog and mixed-signal circuits. The numerical and experimental examples of frequency domain ANN-based testing of filter are presented to demonstrate the usefulness of the histogram approach.
Keywords:
analog fault diagnosis, feature extraction, histogram-based technique
Download:
IMEKO-TC10-2005-06.pdf
DOI:
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Event details
IMEKO TC:
TC10
Event name:
TC10 Conference 2005
Title:

10th IMEKO TC10 Conference on Technical Diagnostics

Place:
Budapest, HUNGARY
Time:
09 June 2005 - 10 June 2005