A method for minimum node selection in diagnostics of analog systems |
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| Adrian Bilski, Jacek Wojciechowski |
- Abstract:
- The aim of this work is to introduce a strategy for finding minimal set of test nodes for diagnostics of complex analog systems with single parametric faults, using SVM classifier as a fault locator. The results of diagnostics of a low-pass filter using taboo search and GA algorithms as node selectors in conjunction with SVM fault classifier are presented.
- Keywords:
- complex analog systems, support vector machine, taboo search, genetic algorithm, parametric fault detection
- Download:
- IMEKO-TC10-2014-014.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC10
- Event name:
- TC10 Workshop on Technical Diagnostics 2014
- Title:
13th IMEKO TC10 Workshop "Advanced measurement tools in technical diagnostics for systems' reliability and safety"
- Place:
- Warsaw, POLAND
- Time:
- 26 June 2014 - 27 June 2014