Single-shot and non-destructive longitudinal monitor by means of Electro-Optical Sampling for future Plasma Wakefield Acceleration experiments |
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| Riccardo Pompili, Maria Pia Anania, Marco Bellaveglia, M. Castellano, Enrica Chiadroni, Alessandro Cianchi, Domenico Di Giovenale, Giampiero Di Pirro, Giancarlo Gatti, F. Giorgianni, Massimo Ferrario, F. Massimo, Andrea |
- Abstract:
- At SPARC-LAB, we have installed an Electro-Optic Sampling (EOS) experiment for single shot, non-destructive measurements of the longitudinal distribution charge of individual electron bunches. The profile of the electron bunch field is electro-optically encoded into a Ti:Sa laser, having 130 fs (rms) pulse length, directly derived from the photocathode’s laser. The bunch profile information is spatially retrieved, i.e., the laser crosses with an angle of 30 deg with respect the normal to the surface of EO crystal (ZnTe, GaP) and the bunch longitudinal profile is mapped into the laser’s transverse profile. In particular, we used the EOS for a single-shot direct visualization of the time profile of a comb-like electron beam, consisting of two bunches, about 100 fs (rms) long, sub-picosecond spaced with a total charge of 160 pC. The electro-optic measurements (done with both ZnTe and GaP crystals) have been validated with both RF Deflector (RFD) and Michelson interferometer measurements.
- Keywords:
- temporal monitor, femtosecond, plasma acceleration, accelerators
- Download:
- IMEKO-TC4-2014-467.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2014
- Title:
20th IMEKO TC4 Symposium on Measurements of Electrical Quantities (together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC)
"Research on Electrical and Electronic Measurement for the Economic Upturn"- Place:
- Benevento, ITALY
- Time:
- 15 September 2014 - 17 September 2014