A SUPER-RESOLUTION MICROSCOPY WITH STANDING EVANESCENT LIGHT AND IMAGE RECONSTRUCTION METHOD |
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| Hiroaki Nishioka, Satoru Takahashi, Kiyoshi Takamasu |
- Abstract:
- We propose a super-resolution microscopy that employs standing evanescent light illumination and image reconstruction method with successive approximation. Samples are illuminated with standing evanescent light, which is formed and shifted into different positions on the interface of total internal reflection (TIR). Scattering light emitted from the illuminated samples is detected through far-field imaging optics. We assume two hypotheses of linearity and incoherence about the scattering light. Then we reconstruct the sample distribution from scattering images and standing evanescent light intensity with successive approximation. We examined this microscopy with one-dimensional computer simulation and demonstrated that super resolution over the diffraction limit is achievable. The resolution power improves with shorter peak-to-peak distance of standing evanescent light and more cycles of the reconstruction calculation. As a possible resolution, two dot samples separated by 50 nm were resolved when the wavelength is 633 nm and the diffraction limit is 594 nm. With two-dimensional computer simulation, we were also able to resolve random dot samples in super resolution by using longitudinal and transversal standing evanescent light.
- Keywords:
- super resolution, standing evanescent light, image reconstruction method
- Download:
- PWC-2006-TC2-002u.pdf
- DOI:
- -
- Event details
- Event name:
- XVIII IMEKO World Congress
- Title:
Metrology for a Sustainable Development
- Place:
- Rio de Janeiro, BRAZIL
- Time:
- 17 September 2006 - 22 September 2006