ADC Testing in Standardized and Non-standardized Ways, Using a Unified Framework |
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| Tamás Virosztek, István Kollár |
- Abstract:
- Several test methods are available to examine static and dynamic properties of analog-todigital converters (ADCs). The most robust and straightforward ones are codified in international standards released by the IEEE, or by the IEC. These methods have been improved based on ideas proposed in scientific papers published in the field of ADC testing. However, there are algorithms and test techniques that are not yet standardized, but could be very useful to achieve more information concerning the device under test. These are predominantly amendments of the standard methods, elaborated to increase the accuracy, robustness, computation demand, etc. Nevertheless, it is important to be able to test ADCs strictly according to the standards, and it can also be important to use methods that go beyond the standardized ones in some aspects. This paper presents an idea to harmonize standard and nonstandard ADC test methods in a single software tool on widely used platforms.
- Keywords:
- ADC testing, standard IEEE-1241, maximum likelihood, parameter estimation, nonlinear least squares
- Download:
- IMEKO-TC4-2014-232.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2014
- Title:
20th IMEKO TC4 Symposium on Measurements of Electrical Quantities (together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC)
"Research on Electrical and Electronic Measurement for the Economic Upturn"- Place:
- Benevento, ITALY
- Time:
- 15 September 2014 - 17 September 2014