Realiable ADC testing using LabVIEW |
|---|
| Vilmos Pálfi, István Kollár |
- Abstract:
- The sinewave histogram test is a commonly used method to characterize nonlinear behavior of A/D converters. Accurate test results require wise choice of the test settings and signal parameters. However, standard methods do not support the recognition of bad parameter settings. In addition, those may provide inaccurate results even when the signal settings are optimal for the histogram test. This paper presents a software which helps handling above problems and deficiencies to guarantee the quality of the test results.
- Keywords:
- ADC testing, histogram test, sine fit, least squares, maximum likelihood
- Download:
- IMEKO-TC4-2014-259.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2014
- Title:
20th IMEKO TC4 Symposium on Measurements of Electrical Quantities (together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC)
"Research on Electrical and Electronic Measurement for the Economic Upturn"- Place:
- Benevento, ITALY
- Time:
- 15 September 2014 - 17 September 2014