Roundoff Errors in the Evaluation of the Cost Function in Sine Wave Based ADC Testing |
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| Balázs Renczes, István Kollár |
- Abstract:
- In this paper sine fitting algorithms are investigated for the purpose of ADC testing. The aim is to decide whether the minimum of the cost function (CF) has been reached. For this, two different types of algorithms, the conventional Levenberg-Marquardt and the genetic-type Differential Evolution methods are investigated in order to compare their optima. It is shown that due to roundoff errors the bottom of the cost function is fairly uneven for conventional number representations for the Maximum Likelihood method, hence the minimum can only be determined with decreased precision. Finally, a band is calculated in which solutions can be considered equivalent, since their CF difference is smaller than roundoff errors.
- Keywords:
- Sine wave fit, Cost Function Evaluation, Maximum Likelihood, ADC testing
- Download:
- IMEKO-TC4-2014-214.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2014
- Title:
20th IMEKO TC4 Symposium on Measurements of Electrical Quantities (together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC)
"Research on Electrical and Electronic Measurement for the Economic Upturn"- Place:
- Benevento, ITALY
- Time:
- 15 September 2014 - 17 September 2014