DEVELOPMENTS OF MEASUREMENT DUE TO TENDENCIES OF MICROELECTRONICS AND A NEW OPTIMIZATION CRITERION |
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| Eugen-Georg Woschni |
- Abstract:
- The paper deals with problems of dynamic behaviour and shows especially how the development of microelectronics influences this field and how to teach this trends applying also heuristic methods and approximations. Using the results of information theory a new optimization criterion is introduced.
- Keywords:
- dynamic behavior, trends, optimization criterion
- Download:
- PWC-2006-TC2-005u.pdf
- DOI:
- -
- Event details
- Event name:
- XVIII IMEKO World Congress
- Title:
Metrology for a Sustainable Development
- Place:
- Rio de Janeiro, BRAZIL
- Time:
- 17 September 2006 - 22 September 2006