Extreme Value Statistical Characterization of Time Domain Pulse-to-Pulse Measurements

Pasquale Arpaia, Carlo Baccigalupi, Michele Martino
Abstract:
An analytical method, based on Extreme Value Theory (EV T), for predicting the worst case repeatability of time domain pulse-to-pulse measurements, modeled as independent and identically distributed random variables, is proposed. The method allows the use of the noise level of a measurement system for predicting the upcoming peak values over a given number of independent observations. The proposed analytical model is compared against simulated distributions generated in Matlab, highlighting satisfying match for any sample size.The simulations are based on a case study on the characterization of a pulsed power supply for the klystron modulators of the Compact LInear Collider (CLIC) under study at CERN.
Keywords:
Worst-Case Uncertainty, Worst-Case Repeatability, Extreme Value Theory, Type-A Uncertainty
Download:
IMEKO-TC4-2014-177.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Symposium 2014
Title:

20th IMEKO TC4 Symposium on Measurements of Electrical Quantities (together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC)
"Research on Electrical and Electronic Measurement for the Economic Upturn"

Place:
Benevento, ITALY
Time:
15 September 2014 - 17 September 2014