ADC test library in LabVIEW |
|---|
| Ján Šaliga, Jozef Lipták, Vojtech Vitkovič, Linus Michaeli |
- Abstract:
- ADC testing requires post processing of the acquired data for the estimation of ADC parameters. LabVIEW, as a very popular tool for development of various control and measurement applications, offers many specialized toolkits and libraries, but a specialized library of functions focused at data processing from ADC testing has been missing until now. Therefore, on the basis of previous works and experience, the Authors have developed a specialized library fully programed in LabVIEW, which offers a variety of high and low level functions – VIs or Virtual Instruments – which markedly simplify the development of any data processing software based on standard test methods. One example of application of the library is the demonstration software accessible across the Internet in the form of web application. It enables performing simulated measurements according to all basic ADC test methods (static, histogram, and dynamic, with processing in time domain and spectral domain). By choosing from among different test condition, the user can also learn and find out how the test conditions can affect the achieved results.
- Keywords:
- ADC test, LabVIEW, IEEE 1057, IEEE 1241
- Download:
- IMEKO-TC4-2014-851.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2014
- Title:
20th IMEKO TC4 Symposium on Measurements of Electrical Quantities (together with 18th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC)
"Research on Electrical and Electronic Measurement for the Economic Upturn"- Place:
- Benevento, ITALY
- Time:
- 15 September 2014 - 17 September 2014