RHEED SIGNAL SAMPLING DEVICE |
|---|
| Romano Giannetti |
- Abstract:
- Monitoring the intensity of the reflected spot in a RHEED image is the most important method used to control the growth of semiconductor crystals in facilities like for example MBE. In some application the availability of the spot intensity signal as an analog voltage is also useful to realize a feedback between the growth dynamics and the external parameters of the plant, such as the cells temperatures and the synchronization of the shutters. Although said analog signal could be obtained by using a photo-detector near the RHEED screen or grabbing and digitizing the RHEED image, these methods are troublesome or expensive respectively. In this paper a simple and cheap solution, based on a synchronized sample and hold operation on the composite video signal, is proposed.
- Keywords:
- RHEED, sampling
- Download:
- IMEKO-TC4-2001-020.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2001
- Title:
11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation (together with 6th IMEKO TC4 Workshop on ADC Modelling and Testing)
- Place:
- Lisbon, PORTUGAL
- Time:
- 13 September 2001 - 14 September 2001