AN APPROACH FOR NEAR-FIELD MEASUREMENT OF RADIATED EMISSIONS FROM DIGITAL CIRCUITS
Alexandru Salceanu, Constantin Sarmasanu, Mihai Cretu
Abstract:
There are presented two E-field and two H-field, versatile, cheap and easy-to-use probes, the effective constructive solutions, the adopted calibration set-up and procedure for measuring their performance factors. As standard reference we used commercial available Agilent and EMCO probes. While trying to improve the EMC characteristics of the prototype of a fluxgate magnetometer, and in consequence near field measuring, problems were encountered. More or less successful attempts are discussed. Some useful techniques and recommendations when dealing with designing PCBs of sensitive equipments are presented.
Keywords:
close E and H fields, electromagnetic radiation, PCB design
Download:
IMEKO-TC4-2001-073.pdf
DOI:
-
Event details
IMEKO TC:
TC4
Event name:
TC4 Symposium 2001
Title:

11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation (together with 6th IMEKO TC4 Workshop on ADC Modelling and Testing)

Place:
Lisbon, PORTUGAL
Time:
13 September 2001 - 14 September 2001
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