UNCERTAINTY REDUCTION IN MEASUREMENT SYSTEMS BY STATISTICAL PARAMETER DESIGN

Pasquale Arpaia, Nello Polese
Abstract:
In measurement system design, uncertainty is usually reduced by a cost increase: more accurate components are selected and narrower variations to influence parameters are imposed. In this paper, an alternative cost-saving approach is proposed: suitable values of design parameters capable of minimizing the measurement uncertainty due both to component’s uncertainty and to influence parameters are identified without any loss in other metrological performances. With this aim, a general method based on statistical parameter design is proposed. The method effectiveness is highlighted by an experimental case study related to the design of a pass-band passive filter.
Keywords:
uncertainty reduction, parameter design, optimization, experiment design, pass-band filter
Download:
IMEKO-TC4-2001-147.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Symposium 2001
Title:

11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation (together with 6th IMEKO TC4 Workshop on ADC Modelling and Testing)

Place:
Lisbon, PORTUGAL
Time:
13 September 2001 - 14 September 2001