PERFORMANCE TESTING OF LOGARITHMIC ANALOG-TO-DIGITAL CONVERTERS |
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| Jorge Guilherme, J. Vital, José Franca |
- Abstract:
- This paper describes test procedures to characterize the behavior of logarithmic analog-to-digital converters. Logarithmic A/D converters are usually characterized in terms of signal-to-noise ratio (SNR) or in deviation of the ideal characteristic in dB. There are a lack of test methods definition in the literature, as can be observed in the IEEE standard 1241 for these type of converters. Systematic test procedures have been applied to µ-law converters according to the G.711 standard, and to a new type of high-speed true logarithmic pipeline A/D converter. DNL and INL had been defined in the logarithmic domain to allow correct characterization of this class of converters.
- Keywords:
- Logarithmic converter, companding, µ-Law converter
- Download:
- IMEKO-TC4-2001-153.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2001
- Title:
11th IMEKO TC4 Symposium on Trends in Electrical Measurements and Instrumentation (together with 6th IMEKO TC4 Workshop on ADC Modelling and Testing)
- Place:
- Lisbon, PORTUGAL
- Time:
- 13 September 2001 - 14 September 2001