CMM DYNAMIC PROPERTIES OF THE SCANNING MEASUREMENT OF A 2D PROFILE
Adam Wo?niak, Grzegorz Krajewski
Abstract:
Scanning probes CMM became currently treated as a standard in coordinate metrology. Not only because of high quantity of data gathering in short time of probing but also scanning technology significantly decrease the inspection time. Modern manufacturing, especially in highly competitive economy, required more efficient measuring machine and processes, because inspection machine quite often become the bottle neck in whole manufacturing process. More efficient in coordinate metrology means faster cycles of measurement with acceptable accuracy. But in fact, scanning speed significantly influenced error budget.
This article proposes a new method of investigating and identifying principal components of CMM dynamic errors. The principle of the method will be presented and the validity of the method will be experimentally confirmed on a bridge Zeiss ACCURA coordinate measuring machine.
Keywords:
measurement, coordinate metrology, scanning probes
Download:
IMEKO-TC14-2014-32.pdf
DOI:
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Event details
IMEKO TC:
TC14
Event name:
TC14 LMPMI Symposium 2014
Title:

11th Symposium on Laser Metrology for Precision Measurement and Inspection in Industry

Place:
Tsukuba, JAPAN
Time:
03 September 2014 - 05 September 2014
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