SHAPE CORRECTION ALGORITHM BY COMPARING SHAPE SILHOUETTE-LINES WITH A SINOGRAM

Trung Vuong Pham, Yutaka Ohtake, Yukie Nagai, Hiromasa Suzuki
Abstract:
In industrial X-ray CT application, there is an increasing demand for achieving accurate surface reconstruction of measured objects for dimensional inspection of mechanical parts since the performance of industrial X-ray CT scanners is considerably improved. In this paper, we propose a novel method that reuses X-ray projection images, or a sinogram, to improve the accuracy of the reconstructed surface mesh by correcting the CT values, which is done by fitting silhouette- lines of the mesh to the sinogram. The sinogram is conventionally used only for obtaining a CT volume data, or a tomogram. Since it has become capable to extract the silhouette-lines correctly regardless of beam hardening etc., reusing the sinogram has the potential application for improving the accuracy of the reconstructed mesh.
Keywords:
X-ray computed tomography, shape silhouette-lines, shape correction
Download:
IMEKO-TC14-2014-40.pdf
DOI:
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Event details
IMEKO TC:
TC14
Event name:
TC14 LMPMI Symposium 2014
Title:

11th Symposium on Laser Metrology for Precision Measurement and Inspection in Industry

Place:
Tsukuba, JAPAN
Time:
03 September 2014 - 05 September 2014