AN IDEA OF AN APPROACH TO SELF-TESTING OF MIXED SIGNAL SYSTEMS BASED ON A QUADRATIC FUNCTION STIMULATION |
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| Zbigniew Czaja |
- Abstract:
- A new approach to self-testing of the analog parts of mixed-signal electronic systems controlled by microcontrollers equipped with an ADC and a DAC is presented. It is based on a BIST and a new fault diagnosis method. A novelty is the use of the DAC as a component of the BIST, allowing to generate a stimulating signal with a quadratic function shape. It contributes to a better extraction of information about the state of the circuit under test.
- Keywords:
- microcontrollers, ADCs, DACs, self-testing, BISTs
- Download:
- IMEKO-WC-2015-TC4-109.pdf
- DOI:
- -
- Event details
- Event name:
- XXI IMEKO World Congress
- Title:
Measurement in Research and Industry
- Place:
- Prague, CZECH REPUBLIC
- Time:
- 30 August 2015 - 04 September 2015