A METHOD OF SELF-TESTING OF ANALOG CIRCUITS BASED ON FULLY DIFFERENTIAL OP-AMPS WITH TCBF CLASSIFIER |
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| Zbigniew Czaja, Michał Kowalewski |
- Abstract:
- A new approach of self-testing of analog circuits based on fully differential op-amps of mixed-signal systems controlled by microcontrollers is presented. It consists of a measurement procedure and a fault diagnosis procedure. We measure voltage samples of a time response of a tested circuit on a stimulation of a unit step function given at the common-mode reference voltage input of the op-amp. The fault detection and fault localization is carried out by the TCBF neural network classifier.
- Keywords:
- neural classifiers, self-testing, microcontrollers, fully differential op-amps
- Download:
- IMEKO-WC-2015-TC4-110.pdf
- DOI:
- -
- Event details
- Event name:
- XXI IMEKO World Congress
- Title:
Measurement in Research and Industry
- Place:
- Prague, CZECH REPUBLIC
- Time:
- 30 August 2015 - 04 September 2015