CHARACTERIZATION OF THE METROLOGICAL STRUCTURAL RESOLUTION OF CT SYSTEMS USING A MULTI-WAVE STANDARD

Francisco A. Arenhart, Vitor C. Nardelli, Gustavo D. Donatelli
Abstract:
This paper presents a method and procedure for characterizing the metrological structural resolution (MSR) of CT systems. The method is based on the frequency response analysis on sinusoidal surfaces. The procedure involves performing evaluations with multiple voxel sizes. To test the method, a comparative evaluation of two CT measuring systems was performed. The results demonstrate the potential of the proposal for assessing the metrological structural resolution of CT systems.
Keywords:
dimensional metrology, computed tomography, surface extraction, structural resolution, transfer function
Download:
IMEKO-WC-2015-TC14-282.pdf
DOI:
-
Event details
Event name:
XXI IMEKO World Congress
Title:

Measurement in Research and Industry

Place:
Prague, CZECH REPUBLIC
Time:
30 August 2015 - 04 September 2015
 Back