COMPARATIVE ANALYSIS OF SURFACE ROUGHNESS MEASUREMENTS OBTAINED WITH THE USE OF CONTACT STYLUS PROFILOMETRY AND COHERENCE SCANNING INTERFEROMETRY |
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| Stanisław Adamczak, Jacek Świderski, Stępień Krzysztof, Tomasz Dobrowolski, Ireneusz Piotr Chmielik |
- Abstract:
- The paper presents comparison of measurements of geometrical surface structure obtained by the contact stylus profilometer and an optical profilometer applying a coherence scanning interferometry method. The measurements were performed on type D1 roughness etalon.
- Keywords:
- surface texture measurement, contact stylus scanning, coherence scanning interferometry
- Download:
- IMEKO-WC-2015-TC14-316.pdf
- DOI:
- -
- Event details
- Event name:
- XXI IMEKO World Congress
- Title:
Measurement in Research and Industry
- Place:
- Prague, CZECH REPUBLIC
- Time:
- 30 August 2015 - 04 September 2015