PARAMETER DESIGN FOR METROLOGICAL CHARACTERISTICS IMPROVEMENT OF A FAST DIGITAL INTEGRATOR AT CERN |
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Pasquale Arpaia, David Giloteaux, Giuseppe Lucariello, Giovanni Spiezia |
- Abstract:
- The reduction of uncertainty in measurement systems is usually obtained through the use of more accurate components. In this paper, this problem is faced by a statistical parameter design procedure. The proposed method is shown to be effective to improve the metrological characteristics of a Fast Digital Integrator developed at European Centre of Nuclear Research.
- Keywords:
- uncertainty reduction, parameter design, fast digital integrator
- Download:
- PWC-2006-TC4-036u.pdf
- DOI:
- -
- Event details
- Event name:
- XVIII IMEKO World Congress
- Title:
Metrology for a Sustainable Development
- Place:
- Rio de Janeiro, BRAZIL
- Time:
- 17 September 2006 - 22 September 2006