PARAMETER DESIGN FOR METROLOGICAL CHARACTERISTICS IMPROVEMENT OF A FAST DIGITAL INTEGRATOR AT CERN

Pasquale Arpaia, David Giloteaux, Giuseppe Lucariello, Giovanni Spiezia
Abstract:
The reduction of uncertainty in measurement systems is usually obtained through the use of more accurate components. In this paper, this problem is faced by a statistical parameter design procedure. The proposed method is shown to be effective to improve the metrological characteristics of a Fast Digital Integrator developed at European Centre of Nuclear Research.
Keywords:
uncertainty reduction, parameter design, fast digital integrator
Download:
PWC-2006-TC4-036u.pdf
DOI:
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Event details
Event name:
XVIII IMEKO World Congress
Title:

Metrology for a Sustainable Development

Place:
Rio de Janeiro, BRAZIL
Time:
17 September 2006 - 22 September 2006