SHORT RUN CONTROL CHARTS AS AN INTERNAL QUALITY CONTROL TOOL |
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| Ana Sofia Matos, José Gomes Requeijo, Inês Coelho, Sandra Gueifão, Isabel Castanheiro |
- Abstract:
- A novel methodology based on short run control charts was developed to establish simultaneous intra and inter daily control of instrumental blank samples for trace elements analysis through inductively coupled plasma mass spectrometry (ICP-MS). Eleven inorganic trace elements were analyzed, where chromium was selected to illustrate the methodology. The use of joint control charts, both based on the Quesenberry Q-statistics, revealed to be a suitable tool in detecting possible instrument contaminations as well as evaluating IPC-MS stability.
- Keywords:
- ICP-MS, instrumental blank samples, trace elements, contamination, short run control chart
- Download:
- IMEKO-WC-2015-TC23-452.pdf
- DOI:
- -
- Event details
- Event name:
- XXI IMEKO World Congress
- Title:
Measurement in Research and Industry
- Place:
- Prague, CZECH REPUBLIC
- Time:
- 30 August 2015 - 04 September 2015