Image Processing of Light-Scattering Images for Qualitative Surface Analysis

Lilli Haar, Katharina Anding, Sven Schröder, Matthias Hauptvogel, Gunther Notni
Abstract:
Light scattering analysis is already used for roughness measurements, but it is also possible to determine defects on surfaces with this method. Therefore, the scattering distribution is recorded and analyzed using image processing. The defects lead to specific characteristics in the images, which can be assigned to them. In this process the segmentation has an important role because only the best possible separation of the error characteristic leads to good results in the further steps of the image processing chain and in the classification process. For this reason, various segmentation methods were applied to two datasets of images of the scattering distributions and their quality was evaluated by means of the obtained recognition rates.
Download:
IMEKO-TC10-2016-007.pdf
DOI:
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Event details
IMEKO TC:
TC10
Event name:
TC10 Workshop on Technical Diagnostics 2016
Title:

14th IMEKO TC10 Workshop “New Perspectives in Measurements, Tools and Techniques for system’s reliability, maintainability and safety”

Place:
Milano, ITALY
Time:
27 June 2016 - 28 June 2016