Parameterization of Nonlinearity for Efficient Estimation in ADC Testing

Tamás Virosztek, István Kollár
Abstract:
In Maximum Likelihood (ML) estimation of ADC parameters, the estimation of static transfer characteristic has key importance. However, the description of static transfer characteristic demands to handle numerous values. Without parameterization, the nonlinearity of an N-bit converter can be described using 2^N - 1 integral nonlinearity (INL) values. Nevertheless for real ADCs the INL values are not independent, the information regarding the nonlinearity can be compressed. This paper enumerates multiple methods to measure and approximate the static transfer characteristic of the ADCs, and evaluates their efficiency. The results are expressed paying attention to the number of parameters and using standard measures for the approximation error (e.g. the l norm of the error vector).
Keywords:
ADC testing, parameterization, INL, estimation, maximum likelihood
Download:
IMEKO-TC4-2016-15.pdf
DOI:
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Event details
IMEKO TC:
TC4
Event name:
TC4 Symposium 2016
Title:

21st IMEKO TC4 Symposium on Measurements of Electrical Quantities (together with 19th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC)
"Understanding the World through Electrical and Electronic Measurement"

Place:
Budapest, HUNGARY
Time:
07 September 2016 - 09 September 2016