Knife Edge Diffraction for Spatially Extended Light Sources |
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| Christian Mentin, Robin Priewald, Eugen Brenner |
- Abstract:
- The position of an object’s edge can be determined from its shadow projected onto a CCD or CMOS sensor without any additional optical elements such as lenses. Nevertheless, in many applications a collimated Laser light beam is used to illuminate the measured object. Since laser diodes are often complicated in handling, and mostly need additional expensive Laser driver hardware, new approaches were considered. Spatially extended light sources such as off-the-shelf LEDs could be used for edge detection in combination with diffraction pattern analysis, without the need of any additional collimation optics for illumination. Results and applicability for simple position measurement are discussed.
- Keywords:
- CCD Sensor, Knife Edge Diffraction
- Download:
- IMEKO-TC4-2016-26.pdf
- DOI:
- -
- Event details
- IMEKO TC:
- TC4
- Event name:
- TC4 Symposium 2016
- Title:
21st IMEKO TC4 Symposium on Measurements of Electrical Quantities (together with 19th TC4 International Workshop on ADC and DCA Modeling and Testing, IWADC)
"Understanding the World through Electrical and Electronic Measurement"- Place:
- Budapest, HUNGARY
- Time:
- 07 September 2016 - 09 September 2016